Search results for "Conventional transmission electron microscope"

Compact, cost-effective and field-portable microscope prototype based on MISHELF microscopy

2016

AbstractWe report on a reduced cost, portable and compact prototype design of lensless holographic microscope with an illumination/detection scheme based on wavelength multiplexing, working with single hologram acquisition and using a fast convergence algorithm for image processing. All together, MISHELF (initials coming from Multi-Illumination Single-Holographic-Exposure Lensless Fresnel) microscopy allows the recording of three Fresnel domain diffraction patterns in a single camera snap-shot incoming from illuminating the sample with three coherent lights at once. Previous implementations have proposed an illumination/detection procedure based on a tuned (illumination wavelengths centered…

Peculiarities of imaging one- and two-dimensional structures in an emission electron microscope. 1. theory

2000

Local changes in work function cause deviations of the electrical microfield near a sample surface as a result of the uniform accelerating field distribution between the sample (cathode) and the extractor electrode (anode). This results in a change in the electron trajectories. As a consequence, the microscope image shows remarkable changes in position, size, intensity and lateral resolution of distinct details, which can be quantitatively described by the calculations presented here. Analysing these effects in the image gives an opportunity to determine the real lateral size of the observed structures and the distribution of local contact potentials.

Probing of nanocontacts inside a transmission electron microscope

2007

In the past twenty years, powerful tools such as atomic force microscopy have made it possible to accurately investigate the phenomena of friction and wear, down to the nanometer scale. Readers of this book will become familiar with the concepts and techniques of nanotribology, explained by an international team of scientists and engineers, actively involved and with long experience in this field. Edited by two pioneers in the field, 'Fundamentals of Frictions and Wear at the Nanoscale' is suitable both as first introduction to this fascinating subject, and also as a reference for researchers wishing to improve their knowledge of nanotribology and to keep up with the latest results in this …

Spatially-multiplexed interferometric microscopy (SMIM): converting a standard microscope into a holographic one

2014

We report on an extremely simple, low cost and highly stable way to convert a standard microscope into a holographic one. The proposed architecture is based on a common-path interferometric layout where the input plane is spatially-multiplexed to allow reference beam transmission in a common light-path with the imaging branch. As consequence, the field of view provided by the layout is reduced. The use of coherent illumination (instead of the broadband one included in the microscope) and a properly placed one-dimensional diffraction grating (needed for the holographic recording) complete the experimental layout. The proposed update is experimentally validated in a regular Olympus BX-60 upri…

Dopant Contrast in Semiconductors as Interpretation Challenge at Imaging by Electrons

2007

Mechanisms responsible for the contrast between differently doped areas in semiconductors, which is observed in electron micrographs, is discussed as regards the key factors determining the sign and magnitude of the contrast. Experimental data obtained by means of the scanning electron microscope (SEM), scanning low energy electron microscope and photoelectron emission microscope are reviewed together with hints following from them for compilation of a model of the contrast mechanism.

The future of transmission electron microscopy (TEM) in biology and medicine.

2000

1996

The uses of atomic force microscopy, scanning tunneling microscopy, electron spectroscopic imaging, electron energy loss spectroscopy and low voltage, high resolution scanning electron microscopy in polymer research are reviewed